CVE-2024-53017

Memory corruption while handling test pattern generator IOCTL command.

CVSS v3 6.6 MEDIUM

6.6^/10

CVSS v3 : MEDIUM

Vector :

Exploitability : 1.8 / Impact : 4.7

Attack Vector LOCAL

Attack Complexity LOW

Privileges Required LOW

User Interaction NONE

Confidentiality Impact LOW

Integrity Impact HIGH

Availability Impact LOW

Scope UNCHANGED

References

Link	Resource
https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html	Vendor Advisory

Configurations

Configuration 1 (hide)

AND

cpe:2.3:o:qualcomm:sdm429w_firmware:-:*:*:*:*:*:*:*

cpe:2.3:h:qualcomm:sdm429w:-:*:*:*:*:*:*:*

Configuration 2 (hide)

AND

cpe:2.3:o:qualcomm:snapdragon_429_mobile_platform_firmware:-:*:*:*:*:*:*:*

cpe:2.3:h:qualcomm:snapdragon_429_mobile_platform:-:*:*:*:*:*:*:*

Configuration 3 (hide)

AND

cpe:2.3:o:qualcomm:wcn3620_firmware:-:*:*:*:*:*:*:*

cpe:2.3:h:qualcomm:wcn3620:-:*:*:*:*:*:*:*

Configuration 4 (hide)

AND

cpe:2.3:o:qualcomm:wcn3660b_firmware:-:*:*:*:*:*:*:*

cpe:2.3:h:qualcomm:wcn3660b:-:*:*:*:*:*:*:*

History

No history.

Information

Published : 2025-06-03 06:15

Updated : 2025-08-20 20:24

NVD link : CVE-2024-53017

Mitre link : CVE-2024-53017

CVE.ORG link : CVE-2024-53017

JSON object : View

Products Affected

qualcomm

sdm429w
snapdragon_429_mobile_platform
wcn3660b
wcn3660b_firmware
snapdragon_429_mobile_platform_firmware
wcn3620
wcn3620_firmware
sdm429w_firmware

CWE

CWE-823

Use of Out-of-range Pointer Offset

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